sigrok-test.git - sigrok-test

Age	Commit message (Collapse)	Author
2019-04-17	i2c: Add ROHM BH1750VFI test-cases.	Uwe Hermann

2018-02-10	i2c: add test for input stream without sample rate (identical decoder output)	Gerhard Sittig
	The existing test did not check the throughput annotation. Which is why the decoder output is identical for input streams with and without a sample rate specification.
2018-02-09	i2c: lack of samplerate is not fatal any longer	Gerhard Sittig

2017-06-06	Add support for initial pin settings.	Uwe Hermann
	Adapt all tests that require it to use the old behaviour of assuming an initial pin value of 0 (or whatever was previously hardcoded in the PD). for now (this will likely see some changes later).
2017-03-28	Add a Sensirion SHT3x test-case.	Uwe Hermann

2017-03-28	Add a Sensirion SHT2x test-case.	Uwe Hermann

2015-12-27	Add OUTPUT_PYTHON test-cases for all PDs.	Uwe Hermann

2015-12-25	Add OUTPUT_BINARY test-cases for all PDs.	Uwe Hermann

2015-10-16	i2c: Add an additional test-case.	Uwe Hermann

2015-04-02	tests: Drop trailing newlines.	Uwe Hermann

2014-09-01	Add initial set of PD tests.	Uwe Hermann
	This is a slightly modified version of the PD test suite that was part of libsigrokdecode previously.